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Competitive Price X-ray Fluorescence Spectrometer
| Price | Negotiable |
|---|---|
| Min Order | 1 Set |
| Availability | In Stock |
| Shipping From | Jiangsu, China |
| Popularity | 328 people viewed |
Model NO.:
JB-EDX8300H
Application:
Industrial
Warranty:
1 Year
Detection Method:
Spectrophotometer
Advantage:
High Sensitive
Principle:
Classic Spectrometer
Wavelengths:
Infrared Spectrometer
Dispersive Element:
Grating Spectrometer
Light Number:
Monochromator
Certification:
RoHS, ISO9001, CE
Customized:
Customized
Item:
X-ray Fluorescence Spectrometer
Measurable Elements:
Na-U
Element Content:
1ppm-99.99%
Detection Limit:
1ppm
Measurement Time:
60-200s (Adjustable)
Power:
AC220±5V
Energy Resolution:
129±5 EV
X-ray Tube Maximum Output Current:
1mA
Trademark:
JIEBO
Transport Package:
Carton Packing for Export
Origin:
Wuxi
Product Description
JB-EDX8300H X-ray Fluorescence Spectrometer
JB-EDX8300H absorbs all the advantages of EDX series and is additionally equipped with vacuum system, so that it expands testing scope, improves the detection limit and enhances the data stability.
Product Features
1. The silicon draft detector imported from America with higher energy resolution largely improves the detection.
2. Limit of light elements which is 100 times higher than that of Si-pin detector. Measurement scope is wider which can almost meet element analysis requirements of all conventional material.
3. Data integration processing system imported from America makes data acquisition faster, measurement more stable with excellent repeatability and long-time stability.
4. Up-to-date software integrating multiple image computering methods makes data measurement more accurate and stable.
5. Software full monitors core parts running ensures safe operation.
6. Specialized vacuum system offers better vacuum performance and excellent testing results.
JB-EDX8300H absorbs all the advantages of EDX series and is additionally equipped with vacuum system, so that it expands testing scope, improves the detection limit and enhances the data stability.
Product Features
1. The silicon draft detector imported from America with higher energy resolution largely improves the detection.
2. Limit of light elements which is 100 times higher than that of Si-pin detector. Measurement scope is wider which can almost meet element analysis requirements of all conventional material.
3. Data integration processing system imported from America makes data acquisition faster, measurement more stable with excellent repeatability and long-time stability.
4. Up-to-date software integrating multiple image computering methods makes data measurement more accurate and stable.
5. Software full monitors core parts running ensures safe operation.
6. Specialized vacuum system offers better vacuum performance and excellent testing results.
| Technical parameter | |
| Analysable Elements | Na-U |
| Analysable Range | 1PPm-99.99% |
| Measurement Time | 100-300s Adjustable |
| RoHS harmful Elements Max Limit | Cd/Pb/Cr/hg/Br/2PPM |
| Energy Resolution | 149±5eV |
| Temperature | 15-30C |
| Power Supply | 220V±5V Optional AC stabilizer Advised |
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