Audited Supplier
BLWP3XXX
Piezoresistive Pressure Sensor
SemiConductor Type
Diffused Silicon Pressure Transmitter
Analog Type
Normal Wirewound
CE
Customized
5VDC~10VDC
1madc
4.5KΩ~5.5KΩ
0.2%Fs/Y
Product Description
All-silicon MEMS absolute pressure sensor series products BLWP3XXX can achieve the precise measurement of external ambient temperature -45ºC ~ 125ºC, multi-range absolute pressure, and has a good linear relationship with the output voltage. This series of pressure sensors has the advantages of small size, high reliability and diversified packaging.
Characteristics:
- Range: 0~ 110,0 ~ 300,0 ~ 700,0 ~ 1000,0 ~1700kPa, etc.(absolute pressure)
- All-silicon structure
- High stability and reliability
- Nonlinearity better than 0.1%
- With 3 times the benchmark range overload capacity
- It has high repeatability and consistency
- Full-scale output voltage 50mV ~ 90mV (typical value for 5V power supply)
Application:
• Automotive electronics • Auxiliary GPS navigation • Weather forecast • Altimeter
| Parameter | Minimum | Typical | Maximum | Unit | Note |
| Supply voltage | 5 | 10 | Vdc | ||
| Working curren | 1 | mAdc | |||
| Bridge arm resistance | 4.5 | 5 | 5.5 | kΩ | |
| Zero bias | -10 | 5 | 30 | mV | |
| Full scale output | 50 | 70 | 90 | mV | @10/1000kpa |
| Non linearity | - | 0.25 | 0.4 | %FS | |
| Zero output temperature coefficient TCO | -0.08 | -0.03 | 0.08 | %FS/ºC | Constant pressure mode |
| -0.08 | -0.04 | 0.08 | %FS/ºC | Constant current mode | |
| Full scale output temperature coefficient TCS | -0.27 | -0.22 | -0.17 | %FS/ºC | Constant pressure mode |
| -0.05 | ±0.02 | 0.05 | %FS/ºC | Constant current mode | |
| Resistance temperature coefficient | 1500 | 2000 | 2500 | ppm/ºC | |
| Hysteresis | - | 0.05 | 0.1 | %FS | |
| Operating temperature | -45 | - | 125 | ºC | |
| Temperature of storage | -55 | - | 150 | ºC | |
| Stability of | 0.2 | %FS/Y | |||
| Over load capacity | 3 times the reference range | ||||
- (1) Detection accuracy of ambient temperature when the sensor is in a constant temperature field;
