Audited Supplier
DJ-SEM150
20X~150, 000X
Video
Scanning Electron Microscope
Desktop
Stereoscopic Effect
Ultraviolet
Drum-shaped Lens
Research
Optics
Polarizing Microscope
DJ-Sem150 Scanning Electron Microscope
5nm (30kv, Se Image)
1kv to 30kv (1kv/5kv/10kv/15kv/20kv/30kv -6 Step)
Se Detector, Optional Bse Detector, Eds, etc.
5-Axis System or Automatic Control
Image Shift X, Y Image Shift (±150um)
Dr. J Scientific
Wooden Case
460(W)*600(L)*950(H)mm
Jiangsu Wuxi
9011800090
Product Description
General introduction:
The maximum magnification of the DJ-SEM150 series SEM is 150,000 times, and the resolution is up to 5nm (SE, 30kV). It is equipped with SE (secondary electron) detector and BSE (backscattered electron) detector. The load platform can be configured with three axes (X, Y, R). The manual platform can also be upgraded to a five-axis (X, Y, R, Z, T) automatic platform. The EDS spectrum analyzer can be configured in all series of products. The products include the following configurations:
Description:
(1) Max Magnification 150,000x
(2) Signal Detection: SE Detector + BSE Detector
(3) Accelerating Voltage:1kV to 30kV, High image resolution, High image resolution;
(4) Equipped with 4 iris diaphragms (30, 50, 50, 100μm), which can provide high-resolution images by changing the size of the electron beam;
(5) EDS is optional, for component analysis
(6) CCD sample navigation is optional
(7) Tilt Stage configuration (0~90°) (optional)
Specifications:
Packing & Shipping
The maximum magnification of the DJ-SEM150 series SEM is 150,000 times, and the resolution is up to 5nm (SE, 30kV). It is equipped with SE (secondary electron) detector and BSE (backscattered electron) detector. The load platform can be configured with three axes (X, Y, R). The manual platform can also be upgraded to a five-axis (X, Y, R, Z, T) automatic platform. The EDS spectrum analyzer can be configured in all series of products. The products include the following configurations:
| Item | Model | With Detector Option | With Stage Option |
| Mini-SEM | DJ-SEM150 | DJ-SEM150S | DJ-SEM150S-MS |
| DJ-SEM150D | DJ-SEM150D-MS | ||
| DJ-SEM150D-ST |
(1) Max Magnification 150,000x
(2) Signal Detection: SE Detector + BSE Detector
(3) Accelerating Voltage:1kV to 30kV, High image resolution, High image resolution;
(4) Equipped with 4 iris diaphragms (30, 50, 50, 100μm), which can provide high-resolution images by changing the size of the electron beam;
(5) EDS is optional, for component analysis
(6) CCD sample navigation is optional
(7) Tilt Stage configuration (0~90°) (optional)
Specifications:
| Resolution | 5nm (30kV,SE) |
| Magnification | 20x~150,000x |
| Accelerating Voltage | 1~30kV |
| Detector | SE Detector, Optional BSE detector, EDS, etc. |
| Electron Gun | Pre centered tungsten filament cartridge |
| Lens system | Focus Lens:2-stage Electromagnetic Condenser Lens Objective Lens: 1-stage Electromagnetic Objective Lens |
| Stage | 3 axis System, X, Y-axis : 35mm / R-axis: 360° Optional 5-axis sample stage: X:40mm, Y:40mm, Z:40mm, R:360°, T:0~90° |
| Image shift | Image shift X, Y Image Shift (±150um) |
| Iris Diaphragms | Adjustable iris diaphragms(30/50/50/100μm) |
| Max Sample size | 80mm in diameter, 35mm in height |
| Image Scanning system | Fast Scan:320*240 Slow Scan: 640*480 Photo Mode 1:1280*960 Photo Mode 2:2560*1920 Photo Mode 3:5120*3840 |
| Automatic Function | Auto start,Auto focus,Auto Brightness/Contrast |
| Image format | BMP, JPEG, PNG, TIFF |
| Image Data display | Magnification,Detector type,Accelerating Voltage,Vacuum mode,Logo(Text),Date and time,Text marker,scale bar |
| Vacuum system | High vacuum mode, mechanical pump, molecular pump, vacuuming time: within 3 minutes |
| Device Volume | 460(W)*600(L)*950(H)mm |
| Equipment environment | Temperature:15ºC~30ºC , Humidity:70% or less Power source:Single phase 100~240V AC, 1KW, 50/60Hz |
Packing & Shipping
