Energy Dispersion X-ray Fluorescence Spectrometer

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WUXI JIEBO INSTRUMENT TECHNOLOGY CO., LTD.

VIP   Audited Supplier 17 years
Profile Certified by SGS/BV
  • Jiangsu, China
  • Jerry He (Mr.)  
    Sales Manager
JB-EDX8300H
Industrial
> 1Year
X-ray
Factory
Energy Dispersive X-ray
Infrared Spectrometer
Grating Spectrometer
Monochromator
RoHS, ISO9001, CE
Customized
Na-U
1ppm-99.9999%
200-600s
JB
Carton Packing for Export
CE, RoHS, ATEX, MA, ExsI
Wuxi
Product Description
JB-EDX8300H X-ray Fluorescence Spectrometer

JB-EDX8300H absorbs all the advantages of EDX series and is additionally equipped with vacuum system, so that it expands testing scope, improves the detection limit and enhances the data stability.

Product Features
1. The silicon draft detector imported from America with higher energy resolution largely improves the detection.
2. Limit of light elements which is 100 times higher than that of Si-pin detector. Measurement scope is wider which can almost meet element analysis requirements of all conventional material.
3. Data integration processing system imported from America makes data acquisition faster, measurement more stable with excellent repeatability and long-time stability.
4. Up-to-date software integrating multiple image computering methods makes data measurement more accurate and stable.
5. Software full monitors core parts running ensures safe operation.
6. Specialized vacuum system offers better vacuum performance and excellent testing results.
 
Technical parameter
Analysable ElementsNa-U
Analysable Range1PPm-99.99%
Measurement Time100-300s Adjustable
RoHS harmful Elements Max LimitCd/Pb/Cr/hg/Br/2PPM
Energy Resolution149±5eV
Temperature15-30C
Power Supply220V±5V Optional AC stabilizer Advised
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