Professional High Quality Industrial Microscope (XIB-PW2001M)

Short Desc: Industrial Microscope XIB-PW2001M
For Analyze Semiconductor, FPD, Precision Mould
Circuit encapsulation, circuit substrate, Material,
Casting/Metal/Ceramic parts, thicker specimen

*Specification:

Viewing Head: Seidentopf Type Binocular
30° Inclined, 360° Rotation
IPD=50-75mm, Diopter adjustment
Eyepiece: WF10X/25MM, WF10X/20MM with reticle 0.1mm

Long working distance Infinite Plan Apochromatic Objective:
* 5X/0.1B. D/W. D. 35.0mm
* 10X/0.25B. D/W. D. 35.0mm
* 20X/0.40B. D/W. D. 20.0mm
* 50X/0.55B. D/W. D. 13.0mm

Nosepiece: Quintuple click-stop, revolving mechanism with ball-bearing
Flashboard type Filters: Green, Blue, Neutral
Checking Tool: 0.01mm Micrometer
Polarization: Analyzer rotatable 360; Polarizer & Analyzer can be moved in/out of the optical path
Stage: Double layers mechanical stage, 190mm X 140mm
With moving slide 50(X) X 40(Y)mm
Condenser: Abbe NA=1.25 with Iris diaphrame and filter
Focusing: Coaxial Coarse and Fine Adjustment
With rack and pinion mechanism
Fine focusing scale value 0.002mm
Epi-Illumination:
With aperture iris diaphragm and field iris diaphragm Halogen Bulb 12V/50W
Power Supply: 85V~265V/50Hz universal power supply

*Standard accessory:
12V/50W halogen lamp ---1PC
Dust cover --- 1PC
English Manual --- 1PC

*Optional accessory:
Eyepiece: WF15X/17mm, WF20X/12.5mm
Long working distance bright & dark field Infinite Plan Objective:
* 50X/0.55B. D/W. D. 5.1mm
* 80X/0.75B. D/W. D. 4.0mm
* 100X/0.80B. D/W. D. 3.0mm
CCD Adaptor 0.5X, 0.57X, 0.75X
Planish Tool

Recommending: 

Through below digital camera eyepiece, the Micro-Image could display 
on computer immediately.