Audited Supplier
XM200
Measure Contour and Roughness of Bearings
0.00001mm
0.02-1%
0.000017mm
0.00001-0.01mm
ZYS
Standard
500*600*800cm
China
9031809090
Product Description
XM series of surface topography measurement instrument is developed by the original on the ZYS technology which is on the basis of absorbing the advanced experience of domestic and foreign similar equipment through continuous improvement and gradually improve, used to measure the various mechanical parts surface micro geometry structure and the geometry of the macro parameter precision instruments, including the type 200 profilometer machinery industry scientific and technological progress second prize, in 2008 and has 3 invention patents, 1 appearance patents.
- This instrument can be used for measure contour and roughness of the bearings.
- With the adjustment table for Y direction and various swing Angle adjustment, users can choose according to the needs of free, easy to use adjustment, complete functions;
- There are many measurement parameters, such as straightness, curvature deviation, double-groove parameters, parallel difference, height and other parameters can be measured, and the surface topography of mechanical parts such as roughness can be measured in strict accordance with domestic standards.
- The measurement accuracy is high. The sensitivity of the differential inductance sensor can reach within 0.01um, and the sensitivity of X-ray photosaccharide can reach within 0.5um.
- There are many measurement control parts, which can not only measure the traditional small displacement in 2 directions and displacement in x direction, but also measure the large displacement in z direction.
- The y-direction moving table is used to measure the 3d surface shape of the part.
- Controlled by microcomputer, it can be used for manual or automatic circulation measurement, automatic elimination of false stem installation, automatic range transformation, direct display of the shape and various parameters, and can be printed out, with standard database storage data.
