Audited Supplier
GA-EDX9900
Online
1 year
XRF Spectrometer
48KG
50W X-ray tube
GONOAVA
Plywood Case
565mm*385mm*415mm
China
9024800000
Product Description
GA-EDX9900 PLUS XRF Spectrometer Energy Dispersive X-Ray Fluorescence Spectrometer
1.Product presentation
GA-EDX9900 PLUS spectrometer is mainly used in mining operations (exploration, mining, grade control), industrial minerals, raw materials for the production of cement and building materials, refractory materials, ceramics and glass, geochemical academic research, archaeology, etc. The excellent linear dynamic range of GA-EDX9900 PLUS enables ultra-high-precision process control and quality control in the cement, mineral, mining, metal, glass and ceramic industries.
The new generation Fast SDD detector with a new vacuum optical system and ultra-high resolution technology can detect light, medium and heavy elements and common oxides (Na20, MgO, Al2O, SiO, P205, SO, K2O, CaO, TiO, Cr2O , MnO, Fe2O, ZnO and SrO, etc.) can achieve the best analysis results.
The excellent analytical performance of GA-EDX9900 PLUS allows it to easily complete the test of the following minerals:
Iron ore (magnetite, hematite, ilmenite, siderite, etc.), copper ore (chalcopyrite, cuprite, malachite, etc.), chromium ore (chromite spinel, chromite, Chromium bismuth ore, etc.), molybdenum ore (molybdenite, copper molybdenite, tungsten molybdenum ore, etc.), tungsten ore (scheelite, wolframite, tintungsten ore, etc.), tantalum ore (tantalite, columbite ore, etc.) , pyrochlore, etc.), lead-zinc ore (galena, sphalerite, cerusite, etc.), nickel ore (later nickel ore, copper-nickel sulfide ore, etc.), bauxite, and other minerals
GA-EDX9900 PLUS XRF Spectrometer Energy Dispersive X-Ray Fluorescence Spectrometer
2.Features
1. Miniaturization, high performance, high speed, easy operation, Nal1-U92 high sensitivity and high precision analysis
2. Can analyze 40 elements at the same time
3. Using multi-collimator, multi-filter and background buckle patented technology
4.Peltier electric cooling FAST SDD silicon drift detector provides excellent short-term repeatability and long-term reproducibility as well as excellent element peak resolution 5. Ultra-high counting digital multi-channel circuit design, double vacuum pumping mechanism, automatic stabilization of vacuum degree system
6. Standard basic parameter method software, multi-tasking, multi-window operation
7. Patented thin film filter technology, effectively improving the detection limit of light elements
GA-EDX9900 PLUS XRF Spectrometer Energy Dispersive X-Ray Fluorescence Spectrometer
3.Newly designed XTEST analysis software
The software core includes the basic parameter method (FP) and the empirical coefficient method (EC), which can easily analyze various samples.
*Spectral processing parameters include those used to define background continuity, stacked peaks and peak summation, smoothness, and the number of measured peak background spectra
*Full correction for absorption as well as thick film and thin film secondary fluorescence, i.e. all matrix effects, enhancement and absorption.
*Spectrum display: peak identification, KLM labeling, spectrum overlap comparison, multiple spectra can be displayed at the same time
*Photopeak intensity can be modeled as a Gaussian function by integrating the net area of the peak or using a measured reference photopeak response.
*Quantitative analysis can be performed using purely fundamental parameter methods, with fundamental parameters of dispersion ratio (for samples containing large amounts of low-ethyl material) or by simple least squares fitting.
*Basic parameter analysis can be based on a single multi-element standard, multiple standards or samples with no standards.4.Product Parameter
1.Product presentation
GA-EDX9900 PLUS spectrometer is mainly used in mining operations (exploration, mining, grade control), industrial minerals, raw materials for the production of cement and building materials, refractory materials, ceramics and glass, geochemical academic research, archaeology, etc. The excellent linear dynamic range of GA-EDX9900 PLUS enables ultra-high-precision process control and quality control in the cement, mineral, mining, metal, glass and ceramic industries.
The new generation Fast SDD detector with a new vacuum optical system and ultra-high resolution technology can detect light, medium and heavy elements and common oxides (Na20, MgO, Al2O, SiO, P205, SO, K2O, CaO, TiO, Cr2O , MnO, Fe2O, ZnO and SrO, etc.) can achieve the best analysis results.
The excellent analytical performance of GA-EDX9900 PLUS allows it to easily complete the test of the following minerals:
Iron ore (magnetite, hematite, ilmenite, siderite, etc.), copper ore (chalcopyrite, cuprite, malachite, etc.), chromium ore (chromite spinel, chromite, Chromium bismuth ore, etc.), molybdenum ore (molybdenite, copper molybdenite, tungsten molybdenum ore, etc.), tungsten ore (scheelite, wolframite, tintungsten ore, etc.), tantalum ore (tantalite, columbite ore, etc.) , pyrochlore, etc.), lead-zinc ore (galena, sphalerite, cerusite, etc.), nickel ore (later nickel ore, copper-nickel sulfide ore, etc.), bauxite, and other minerals
GA-EDX9900 PLUS XRF Spectrometer Energy Dispersive X-Ray Fluorescence Spectrometer
2.Features
1. Miniaturization, high performance, high speed, easy operation, Nal1-U92 high sensitivity and high precision analysis
2. Can analyze 40 elements at the same time
3. Using multi-collimator, multi-filter and background buckle patented technology
4.Peltier electric cooling FAST SDD silicon drift detector provides excellent short-term repeatability and long-term reproducibility as well as excellent element peak resolution 5. Ultra-high counting digital multi-channel circuit design, double vacuum pumping mechanism, automatic stabilization of vacuum degree system
6. Standard basic parameter method software, multi-tasking, multi-window operation
7. Patented thin film filter technology, effectively improving the detection limit of light elements
GA-EDX9900 PLUS XRF Spectrometer Energy Dispersive X-Ray Fluorescence Spectrometer
3.Newly designed XTEST analysis software
The software core includes the basic parameter method (FP) and the empirical coefficient method (EC), which can easily analyze various samples.
*Spectral processing parameters include those used to define background continuity, stacked peaks and peak summation, smoothness, and the number of measured peak background spectra
*Full correction for absorption as well as thick film and thin film secondary fluorescence, i.e. all matrix effects, enhancement and absorption.
*Spectrum display: peak identification, KLM labeling, spectrum overlap comparison, multiple spectra can be displayed at the same time
*Photopeak intensity can be modeled as a Gaussian function by integrating the net area of the peak or using a measured reference photopeak response.
*Quantitative analysis can be performed using purely fundamental parameter methods, with fundamental parameters of dispersion ratio (for samples containing large amounts of low-ethyl material) or by simple least squares fitting.
*Basic parameter analysis can be based on a single multi-element standard, multiple standards or samples with no standards.4.Product Parameter
| Instrument Specifications | |
| Size of Spectromete Size of sample chamber Size of Vacuumsample chamber Weight Element Range Analysis content range Detector DPP Analyzer Excitation Source HV unit Power supply Environment | 565mm*385mm*415mm 465mm*330mm*110mm Ф150mm x height 75mm 48Kg Na11-U92 ppm-99.99% AmpTekhghresolution Fast SDD 4096 Channel DPP analyzer 50W X-ray tube D-50kV 220ACV 50/60Hz 10ºC to 35ºC |
| Standard | Optional |
| Ag-Calibration standard Vacuumpump Sample cup USB cable Power supply cable TestMylar Calibration report Warranty card | Mill machine Sample pressing machine Drying oven Fusing bead machine Balance MineralStandard samples Power stabilizer 150 mesh sleve |
