Audited Supplier
KYKY-EM6910
KYKY
Beijing, China
Product Description
KYKY-EM6910 Tungsten filament SEM
Large beam current and beam spot size, suitable for a long time accurate analysis, Chinese and English operation interface, with automatic adjustment, automatic correction, automatic detection and One-Key image functions. The beginners can also quickly grasp the operation method, easy to obtain the analysis results
Features
High resolution, good image quality
Pre-centering tungsten cathode, optional LaB6 filament
Chinese and English operation interface, with One-Key image function
Low maintenance and repair cost
Technical specifications of SEM KYKY-EM6910
Resolution
3nm@30kV(SE);4nm@30kV(BSE)
Magnifications:1X-450000X;
Electron gun: Tungsten filament electron gun
Acceleration voltage:0.2~30kV
Auto functions:Focus, brightness/contrast, astigmatism, E-beam alignment;
Detectors:
High vacuum secondary electron detector (SE) ;
Integrated backscatter detector (BSE);
Infrared CCD camera;
Sample stages:
Five-axis automatic medium-sized sample stage
X:0~80mm
Y:0~50mm
Z:0~30mm
R:360°
T:-5°~70°
Max Specimen Diameter: 175mm;
Max height of Specimen: 30mm;
Touching alarm and auto-stop, in case of misoperatio
Optional detectors: EDS,EBSD,CL,EBIC, etc.
Applications
Battery materials, semiconductors, composite materials, polymers, animals and plants, microorganisms, powder metallurgy, minerals, metal industry, building materials, chemical materials, ceramic materials etc.
Large beam current and beam spot size, suitable for a long time accurate analysis, Chinese and English operation interface, with automatic adjustment, automatic correction, automatic detection and One-Key image functions. The beginners can also quickly grasp the operation method, easy to obtain the analysis results
Features
High resolution, good image quality
Pre-centering tungsten cathode, optional LaB6 filament
Chinese and English operation interface, with One-Key image function
Low maintenance and repair cost
Technical specifications of SEM KYKY-EM6910
Resolution
3nm@30kV(SE);4nm@30kV(BSE)
Magnifications:1X-450000X;
Electron gun: Tungsten filament electron gun
Acceleration voltage:0.2~30kV
Auto functions:Focus, brightness/contrast, astigmatism, E-beam alignment;
Detectors:
High vacuum secondary electron detector (SE) ;
Integrated backscatter detector (BSE);
Infrared CCD camera;
Semiconductor BSE detector
Sample stages:
Five-axis automatic medium-sized sample stage
X:0~80mm
Y:0~50mm
Z:0~30mm
R:360°
T:-5°~70°
Max Specimen Diameter: 175mm;
Max height of Specimen: 30mm;
Touching alarm and auto-stop, in case of misoperatio
Optional detectors: EDS,EBSD,CL,EBIC, etc.
Applications
Battery materials, semiconductors, composite materials, polymers, animals and plants, microorganisms, powder metallurgy, minerals, metal industry, building materials, chemical materials, ceramic materials etc.
